Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM. (Record no. 196020)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00429nam a2200133Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 211018s9999||||xx |||||||||||||| ||und|| |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.31 |
| Item number | JO-A |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Joshi, Bhuwan Chandra. |
| 245 #0 - TITLE STATEMENT | |
| Title | Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM. |
| Statement of responsibility, etc | Joshi |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Year of publication | 2014 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xi; 51p. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Thesis & Dissertations |
| Damaged status | Permanent Location | Current Location | Shelving location | Date acquired | Accession Number | Koha item type |
|---|---|---|---|---|---|---|
| Central Library, NIT Jalandhar | Central Library, NIT Jalandhar | 20.10.2021 | TH000746 | Thesis & Dissertations |