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Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM.

Joshi, Bhuwan Chandra.

Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM. Joshi - Dr.B.R.Amb - Jalandhar. Dr.B.R.Ambedkar National Institute of Te 2014 - xi; 51p.

Dewey Class. No.: 621.31 / JO-A

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