000 00395nam a2200133Ia 4500
008 210219s9999||||xx |||||||||||||| ||und||
082 _a621.3810287
_bLE-M
100 _aLenk, John D.
245 0 _aMcgraw-Hill electronics testing handbook:Procedures and techniques.
_c John D.Lenk
260 _aNew York.
_bMcgrwa Hill.
_c1994
300 _axvii, 397p
942 _cBK
950 _o621.3810287 LE-M
999 _c29060
_d29060