000 00676nam a22001817a 4500
005 20230908121825.0
008 230908b |||||||| |||| 00| 0 eng d
041 _aeng
082 _a621
100 _aVISHAL KUMAR
_931049
245 _aInvestigation of DFT methods with Faults coverage Debug and Analysis
260 _bDepartment of Electronics and Communication Engineering Dr. B.R. Ambedkar National Institute of Technology Jalandhar 144008, Punjab (India)
_c2023
300 _a63p
502 _aTHIS THESIS BELONGS TO DEPARTMENT OF ELECTRONICS AND COMMUNICATION ENGINEERING
526 _aMTECH
_b21204116
700 _eSukwinder Singh,Manjeet Singh
942 _cTH
999 _c198605
_d198605