Built In test for VLSI:Pseudorandom techniques Paul HBardell

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Material type: Text

TextPublication details: New York John Wiley 1987Description: xiii,354DDC classification:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Status	Date due	Barcode
Books and Monographs	Central Library, NIT Jalandhar General Stacks	Central Library, NIT Jalandhar			Available		84492