VISHAL KUMAR <br/><br/>
Investigation of DFT methods with Faults coverage  Debug and Analysis 

 -  Department of Electronics and Communication Engineering Dr. B.R. Ambedkar National Institute of Technology  Jalandhar 144008, Punjab (India)  2023 
 - 63p 
<br/><br/>THIS THESIS BELONGS TO DEPARTMENT OF ELECTRONICS AND COMMUNICATION ENGINEERING 
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<br/><br/><label>Dewey Class. No.: </label>621