Joshi, Bhuwan Chandra. <br/><br/>
Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM. 
Joshi 
 - Dr.B.R.Amb 
 - Jalandhar.  Dr.B.R.Ambedkar National Institute of Te  2014 
 - xi; 51p. 
<br/><br/><label>Dewey Class. No.: </label>621.31  / JO-A