Image from Google Jackets

Normal view MARC view ISBD view

Digital circuit testing Francis CWang

By:

Wang,Francis C

Material type: Text

Text

TextPublication details: New York Academic Press 1991Description: xi,233DDC classification:

621.3815 WA-D

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings ( 1 )

Holdings
Item type	Current library	Home library	Call number	Materials specified	Status	Date due	Barcode
Books and Monographs	Central Library, NIT Jalandhar General Stacks	Central Library, NIT Jalandhar			Available		84491

Print
Unhighlight Highlight
Send to device
Save record
BIBTEX ISBD RIS MARC (Unicode/UTF-8)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Managed by: Dr. D. P. Tripathi, Deputy Librarian, Central Library

Dr. B. R. Ambedkar National Institute of Technology Jalandhar

For any query / question, please mail at circulation.liby@nitj.ac.in

website counter

Powered by Koha