Normal view MARC view ISBD view

Digital systems testing & testable design.

Abramovici, Miron., Ed.

Digital systems testing & testable design. Miron.Abramovici - New Jesrsy. IEEE Press. 1990 - xvii; 652p

Dewey Class. No.: 621.38174 / A564D

Print
Send to device
Save record
BIBTEX ISBD RIS MARC (Unicode/UTF-8)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)